Basic ESD and I/O Design by Sanjay Dabral (English) Hardcover Book

Description: FREE SHIPPING UK WIDE Basic ESD and I/O Design by Sanjay Dabral, Timothy Maloney This book addresses the large gap between the fragmented research ESD (Electrostatic Discharge) and design practices used in VLSI design. It brings a simplified design perspective to IO (Input/Output) and ESD design, and presents a common understanding for the IO designer about ESD constraints and for the ESD Process designer about IO requirements. FORMAT Hardcover LANGUAGE English CONDITION Brand New Publisher Description The first comprehensive guide to ESD protection and I/O design Basic ESD and I/O Design is the first book devoted to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much-needed reference for practicing engineers who are frequently called upon to learn the subject on the job. This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve. Basic ESD and I/O Design: * Describes strategies for design-oriented ESD protection * Explains layout methods that enhance ESD protection designs * Addresses basic I/O designs, including new problems such as mixed voltage interfaces * Discusses fabrication aspects affecting ESD and I/O protection * Illustrates concepts using numerous figures and examples * Expresses device physics in terms of simple electrical circuit models * Cross-references the material to standard texts in the field Essential for engineers in industry and anyone designing circuits, systems, or devices for future technologies, Basic ESD and I/O Design is also a useful reference for researchers and graduate students involved in core VLSI design or computer architecture. Back Cover The first comprehensive guide to ESD protection and I/O design Basic ESD and I/O Design is the first book devoted to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much-needed reference for practicing engineers who are frequently called upon to learn the subject on the job. This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve. Basic ESD and I/O Design: Describes strategies for design-oriented ESD protection Explains layout methods that enhance ESD protection designs Addresses basic I/O designs, including new problems such as mixed voltage interfaces Discusses fabrication aspects affecting ESD and I/O protection Illustrates concepts using numerous figures and examples Expresses device physics in terms of simple electrical circuit models Cross-references the material to standard texts in the field Essential for engineers in industry and anyone designing circuits, systems, or devices for future technologies, Basic ESD and I/O Design is also a useful reference for researchers and graduate students involved in core VLSI design or computer architecture. Flap The first comprehensive guide to ESD protection and I/O design Basic ESD and I/O Design is the first book devoted to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much-needed reference for practicing engineers who are frequently called upon to learn the subject on the job. This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve. Basic ESD and I/O Design: Describes strategies for design-oriented ESD protection Explains layout methods that enhance ESD protection designs Addresses basic I/O designs, including new problems such as mixed voltage interfaces Discusses fabrication aspects affecting ESD and I/O protection Illustrates concepts using numerous figures and examples Expresses device physics in terms of simple electrical circuit models Cross-references the material to standard texts in the field Essential for engineers in industry and anyone designing circuits, systems, or devices for future technologies, Basic ESD and I/O Design is also a useful reference for researchers and graduate students involved in core VLSI design or computer architecture. Author Biography SANJAY DABRAL received his PhD in electrical engineering from Rensselaer Polytechnic Institute. An independent consultant, he is also involved in developing high-speed I/O buses. TIMOTHY J. MALONEY has degrees in physics and electrical engineering from MIT and Cornell University. He is a Principal Engineer at Intel Corporation and has won the Intel Achievement Award for his patented ESD protection devices. A Senior Member of the IEEE, he has several patents issued and several more pending. Table of Contents ESD Protection Methodology. Additional ESD Considerations. Circuits. Layout Issues. ESD and I/O Interactions. Mixed-Voltage ESD. ESD Reliability Measurement and Failure Analysis Basics. Conclusion. Index. Long Description The first comprehensive guide to ESD protection and I/O design Basic ESD and I/O Design is the first book devoted to ESD (electrostatic discharge) protection and input/output design. Addressing the growing demand in industry for high-speed I/O designs, it bridges the gap between ESD research and current VLSI design practices and provides a much-needed reference for practicing engineers who are frequently called upon to learn the subject on the job. This volume presents an integrated treatment of ESD, I/O, and process parameter interactions that both I/O designers and process designers can use. It examines key factors in I/O and ESD design and testing, and helps the reader consider ESD and reliability issues up front when making I/O choices. Emphasizing clarity and simplicity, this book focuses on design principles that can be applied widely as this dynamic field continues to evolve. Basic ESD and I/O Design: Describes strategies for design-oriented ESD protection Explains layout methods that enhance ESD protection designs Addresses basic I/O designs, including new problems such as mixed voltage interfaces Discusses fabrication aspects affecting ESD and I/O protection Illustrates concepts using numerous figures and examples Expresses device physics in terms of simple electrical circuit models Cross-references the material to standard texts in the field Essential for engineers in industry and anyone designing circuits, systems, or devices for future technologies, Basic ESD and I/O Design is also a useful reference for researchers and graduate students involved in core VLSI design or computer architecture. Feature Presents an integrated view of ESD, IO and process parameter interactions. Cross indexed to standard references. Numerous figures and examples are used to explain concepts. Details ISBN0471253596 Short Title BASIC ESD & I/O DESIGN Pages 328 Language English ISBN-10 0471253596 ISBN-13 9780471253594 Media Book Format Hardcover DEWEY 621.395 Illustrations Yes Place of Publication New York Country of Publication United States Edition 1st Author Timothy Maloney Residence CA Affiliation Consultant, Milpitas, CA DOI 10.1604/9780471253594 UK Release Date 1999-01-05 AU Release Date 1998-11-30 NZ Release Date 1998-11-30 Publisher John Wiley & Sons Inc Year 1999 Publication Date 1999-01-05 Imprint Wiley-Interscience Replaced by 9780471488538 Audience Undergraduate US Release Date 1999-01-05 We've got this At The Nile, if you're looking for it, we've got it. With fast shipping, low prices, friendly service and well over a million items - you're bound to find what you want, at a price you'll love! 30 DAY RETURN POLICY No questions asked, 30 day returns! FREE DELIVERY No matter where you are in the UK, delivery is free. 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