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Design-For-Test for Digital Ic's & Embedded Core Systems

Description: Note: Any images shown are stock photographs and product may differ from what is shown. You are purchasing a Good copy of 'Design-For-Test for Digital Ic's & Embedded Core Systems'Condition Notes: This item shows signs of wear from consistent use, but it remains in good condition and is a good working copy. All pages and cover are intact , but may have aesthetic issues such as small tears, bends, scratches, and scuffs. Spine may also show signs of wear.

Price: 8.99 USD

Location: Dayton, Ohio

End Time: 2024-10-27T14:17:33.000Z

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Design-For-Test for Digital Ic

Item Specifics

Return shipping will be paid by: Buyer

All returns accepted: Returns Accepted

Item must be returned within: 30 Days

Refund will be given as: Money Back

Return policy details:

Release Year: 1999

Book Title: Design-For-Test for Digital Ic's & Embedded Core Systems

Number of Pages: 384 Pages

Language: English

Publication Name: Design-For-Test for Digital Ic's and Embedded Core Systems

Publisher: Prentice Hall PTR

Publication Year: 1999

Item Height: 0.8 in

Subject: Electronics / General, Electronics / Digital

Type: Textbook

Item Weight: 21.4 Oz

Item Length: 9.1 in

Author: Alfred Crouch

Subject Area: Technology & Engineering

Item Width: 7.1 in

Format: CD-ROM / Trade Paperback

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