Description: New Hard cover
Price: 109.42 USD
Location: Sparks, Nevada
End Time: 2025-02-02T11:17:25.000Z
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Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Book Title: Electromigration in Metals: Fundamentals to Nano-Interconnects
Publication Date: 2022-05-12
Number of Pages: 400 Pages
Publication Name: Electromigration in Metals : Fundamentals to Nano-Interconnects
Language: English
Publisher: Cambridge University Press
Subject: Materials Science / General, Engineering (General)
Publication Year: 2022
Item Height: 0.9 in
Type: Textbook
Item Length: 9.8 in
Author: Paul Ho, Martin Gall, Chao-Kun Hu, Valeriy Sukharev
Subject Area: Technology & Engineering
Item Width: 6.9 in
Format: Hardcover
