Description: New Hard cover
Price: 125.48 USD
Location: Sparks, Nevada
End Time: 2025-01-25T11:26:38.000Z
Shipping Cost: 0 USD
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Item Specifics
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money Back
Publication Date: 2010-08-25
Pages: 312
Publisher: World Industries Scientific Publishing Co Pte LTD
Publication Year: 2010
Topic: Electronics / Semiconductors, Electronics / Microelectronics, Electronics / Circuits / Vlsi & Ulsi, Electronics / Circuits / Integrated, Physics / General
Book Title: Electromigration in Ulsi Interconnections
Number of Pages: 450 Pages
Language: English
Genre: Technology & Engineering, Science
Item Weight: 0 Oz
Author: Cher Ming Tan
Format: Hardcover
