Description: This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for the electromigration effects inside logic cells of a circuit. They show in this book that an interconnect inside a cell can fail reducing considerably the circuit lifetime and they demonstrate a methodology to optimize the lifetime of circuits, by placing the output, Vdd and Vss pin of the cells in the less critical regions, where the electromigration effects are reduced. Readers will be enabled to apply this methodology only for the critical cells in the circuit, avoiding impact in the circuit delay, area and performance, thus increasing the lifetime of the circuit without loss in other characteristics.
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Location: Gloucester
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EAN: 9783319840413
UPC: 9783319840413
ISBN: 9783319840413
MPN: N/A
Recommended Age Range: 0-12 months
Book Title: Electromigration Inside Logic Cells: Modeling, Ana
Item Length: 23.4 cm
Number of Pages: 118 Pages
Publication Name: Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS
Language: English
Publisher: Springer International Publishing A&G
Item Height: 235 mm
Subject: Computer Science, Physics
Publication Year: 2018
Type: Textbook
Item Weight: 226 g
Subject Area: Material Science
Author: Sachin S. Sapatnekar, Ricardo Reis, Gracieli Posser
Item Width: 155 mm
Format: Paperback
