Description: By Jack Darr and Delton T. Horn 2nd Edition First printing Book is well read, cover has a lot of wear along the edges, minor rips along the edges and has bends in it. Minor rip along the edge of the spine at the cover and very minor water damage to the lower corner of the book at the spine (about 1/4 inch). Book is a former library book with the usual marks and stamps from library usage.
Price: 10 USD
Location: Randolph, Virginia
End Time: 2024-11-12T21:22:05.000Z
Shipping Cost: 4.63 USD
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Item Specifics
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money back or replacement (buyer's choice)
Brand: Unbranded
MPN: Does not apply
Features: Ex-Library
Country/Region of Manufacture: United States
Publisher: McGraw-Hill School Education Group
Edition: 2
Topic: Electronics / General
Book Title: How to Test Almost Everything Electronic
Publication Year: 1988
Number of Pages: 180 Pages
Language: English
Illustrator: Yes
Genre: Technology & Engineering
Author: Jack Darr, Delton T. Horn
Format: Trade Paperback
