Description: Hardcover in dust jacket. Covers are bright and intact. NO highlighting. NO underlining. FREE SHIPPING with tracking. Attached picture shows the actual book you will receive. Ref BG 83.
Price: 74.95 USD
Location: 20772
End Time: 2025-02-04T05:59:22.000Z
Shipping Cost: 0 USD
Product Images
![INFRARED CHARACTERIZATION FOR MICROELECTRONICS [Hardcover] Lau, Wai Shing](https://i.ebayimg.com/images/g/8KMAAOSwax5YpV7Q/s-l640.jpg "INFRARED CHARACTERIZATION FOR MICROELECTRONICS [Hardcover] Lau, Wai Shing")
Item Specifics
Restocking Fee: No
Return shipping will be paid by: Buyer
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
Refund will be given as: Money back or replacement (buyer's choice)
Book Title: See Title Above
Number of Pages: X, 160 Pages
Publication Name: Infrared Characterization for Microelectronics
Language: English
Publisher: World Industries Scientific Publishing Co Pte LTD
Publication Year: 1999
Subject: Materials Science / General, Electronics / Microelectronics
Item Weight: 12.8 Oz
Type: Textbook
Subject Area: Technology & Engineering
Author: W. S. Lau
Format: Hardcover
![INFRARED CHARACTERIZATION FOR MICROELECTRONICS [Hardcover] Lau, Wai Shing](https://i.ebayimg.com/images/g/8KMAAOSwax5YpV7Q/s-l600.webp)
