Description: Journey to Data Qualityby Lee, Yang W.; Pipino, Leo L.; Funk, James D.; Wang, Richard Y. Description: It's a preowned item in good condition and includes all the pages. It may have some general signs of wear and tear, such as markings, highlighting, slight damage to the cover, minimal wear to the binding, etc., but they will not affect the overall reading experience.Product ID: 0262513358-11-1
Price: 10.94 USD
Location: Philadelphia, Pennsylvania
End Time: 2024-10-28T23:38:52.000Z
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Return shipping will be paid by: Seller
All returns accepted: Returns Accepted
Item must be returned within: 30 Days
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Book Title: Journey to Data Quality
Number of Pages: 240 Pages
Language: English
Publication Name: Journey to Data Quality
Publisher: MIT Press
Publication Year: 2009
Subject: Data Modeling & Design, Industrial Management, Databases / General, Enterprise Applications / General, Information Technology
Item Height: 0.5 in
Type: Textbook
Item Weight: 11 Oz
Item Length: 8.9 in
Author: James D. Funk, Leo L. Pipino, Y. Lee, Yang W. Lee, Richard Y. Wang
Subject Area: Computers, Business & Economics
Item Width: 6.3 in
Format: Trade Paperback
