Description: Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17–19, 2018, Proceedings, Paperback by Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT), ISBN 3319977849, ISBN-13 9783319977843, Like New Used, Free shipping in the US This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018.
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Book Title: Structural, Syntactic, and Statistical Pattern Recognition : Join
Number of Pages: Xiii, 524 Pages
Publication Name: Structural, Syntactic, and Statistical Pattern Recognition : Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings
Language: English
Publisher: Springer International Publishing A&G
Publication Year: 2018
Subject: Programming / General, Programming / Algorithms, Image Processing, Intelligence (Ai) & Semantics, Computer Science, Cognitive Psychology & Cognition, Algebra / General, Computer Vision & Pattern Recognition
Item Weight: 28.9 Oz
Type: Textbook
Subject Area: Mathematics, Computers, Psychology
Author: Edwin R. Hancock
Item Length: 9.3 in
Series: Lecture Notes in Computer Science Ser.
Item Width: 6.1 in
Format: Trade Paperback
