Description: New Hard cover
Price: 209.72 USD
Location: Sparks, Nevada
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Return shipping will be paid by: Buyer
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Item must be returned within: 30 Days
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Book Title: VLSI Test Principles and Architectures: Design for Testability
Publication Date: 2006-06-01
Pages: 808
Number of Pages: 808 Pages
Language: English
Publication Name: Vlsi Test Principles and Architectures : Design for Testability
Publisher: Elsevier Science & Technology
Publication Year: 2006
Subject: Industrial Design / Product, Electronics / Circuits / Vlsi & Ulsi, Electronics / Circuits / Integrated, Technical & Manufacturing Industries & Trades
Type: Textbook
Item Length: 9.2 in
Subject Area: Technology & Engineering
Author: Xiaoqing Wen, Cheng-Wen Wu, Laung-Terng Wang
Item Width: 7.5 in
Format: Hardcover
